包含Kink效应的改进型GaN HEMTs模型

An Improved Model for GaN HEMTs with Kink Effect

  • 摘要: 提出了一种GaN高电子迁移率晶体管(HEMTs)建模方法.该模型以ADS(advanced design system)中的符号定义器件SDD(symbolically defined device)为基础,结合宽带<i<S</i<-参数与脉冲直流测试数据,对GaN器件进行精确建模.本文所用晶体管为双指AlGaN/GaN HEMT器件,其栅长为90 nm,单指栅宽为40 μm.数据测试采用在片测试方法,在常规<i<S</i<参数测试和直流测试基础上,增加了脉冲直流测试,并针对测试数据体现的Kink效应和阈值电压漂移现象进行建模.研究结果表明,该模型可以准确拟合器件0~110 GHz <i<S</i<参数及直流特性,谐波平衡仿真显示该模型具有良好的收敛特性,可用于GaN HEMTs器件电路仿真.

     

    Abstract: An improved model for AlGaN/GaN HEMTs including Kink effect was presented in this paper. This large signal model was constructed based on the symbolically defined device (SDD) form of advanced design system (ADS). The improved <i<I-V</i< expression was proposed to complete nonlinear fitting accurately by contrasting the measure results of the on-wafer AlGaN/GaN HEMT with two gate fingers each being 90 nm long and 40 μm wide. The model can accurately fit the 0~110 GHz <i<S</i<-parameter and DC characteristics of the device. The convergence of the model is great during the harmonic balance simulation. So this modeling method can be applied to millimeter-wave GaN HEMTs.

     

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