LIU Jianhua, NI Jing, XIA Huanxiong, ZHANG Jian, AO Xiaohui, LUO Juncheng, ZHANG Xuerui, FU Zhihao, ZHANG Hui. Microstructure Evolution of Assembly Contact Interface Under Micro-VibrationJ. Transactions of Beijing institute of Technology, 2025, 45(2): 175-184. DOI: 10.15918/j.tbit1001-0645.2024.075
Citation: LIU Jianhua, NI Jing, XIA Huanxiong, ZHANG Jian, AO Xiaohui, LUO Juncheng, ZHANG Xuerui, FU Zhihao, ZHANG Hui. Microstructure Evolution of Assembly Contact Interface Under Micro-VibrationJ. Transactions of Beijing institute of Technology, 2025, 45(2): 175-184. DOI: 10.15918/j.tbit1001-0645.2024.075

Microstructure Evolution of Assembly Contact Interface Under Micro-Vibration

  • To address the unclear evolution patterns and undefined characterization parameters of assembly contact interface states under micro-vibration, an experimental and analytical method was proposed to characterize contact interface state changes in the view of surface topography evolution. Firstly, an experimental system was constructed to simulate the tangential vibration of contact interfaces under normal loading, revealing the evolution patterns of contact surface topographies with different initial roughness. Results show that the void volume in the valley areas of the surface profile can significantly decrease with increasing initial roughness. And then, the correlation between initial surface roughness and 17 parameters across five categories was analyzed regarding power of spectral energy, profile height, area ratio, volume distribution, and anisotropic features, identifying key parameters that characterize the micro-topography evolution of contact interfaces. The results can provide empirical data and analytical methods for contact mechanics and precision assembly stability studies.
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