LIU Feng, JIN Lei, NIU Shao-hua, LIU Hai-peng, GUO Jian-chang. A Low-Power MEMS Piezoresistive Sensor Dynamic Test SystemJ. Transactions of Beijing institute of Technology, 2019, 39(2): 215-220. DOI: 10.15918/j.tbit1001-0645.2019.02.018
Citation: LIU Feng, JIN Lei, NIU Shao-hua, LIU Hai-peng, GUO Jian-chang. A Low-Power MEMS Piezoresistive Sensor Dynamic Test SystemJ. Transactions of Beijing institute of Technology, 2019, 39(2): 215-220. DOI: 10.15918/j.tbit1001-0645.2019.02.018

A Low-Power MEMS Piezoresistive Sensor Dynamic Test System

  • In order to accurately analyze the penetrating overload signal, a low-power, high-load dynamic test system was proposed. The system could withstand 2×10<sup<5</sup<<i<g</i< overload signals. In order to achieve the characteristics of high sampling rate, low power consumption, and shock resistance, the system adopted silicon crystal oscillator as the main oscillator, using low-power CMOS chips. When the system started to work, the processor entered the deep sleep mode and started to supply power to the peripheral circuit when entering the transmit mode. When the missile emitted a signal, a trigger signal from the hysteresis trigger circuit would be generated, so the acquisition system was started to collect data. Experiments have shown that with this scheme, the life cycle of the missile can be prolonged, and the overload signal of the air gun can be accurately collected.
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