WANG Guo-hui, LI Xiang-rong, ZHAO Bo, ZHAO Shuo. Simulation of Strong Battle Tanks Electronic Components Failure Mechanism Under the Shock LoadJ. Transactions of Beijing institute of Technology, 2015, 35(s2): 157-160. DOI: 10.15918/j.tbit1001-0645.2015.S2.038
Citation: WANG Guo-hui, LI Xiang-rong, ZHAO Bo, ZHAO Shuo. Simulation of Strong Battle Tanks Electronic Components Failure Mechanism Under the Shock LoadJ. Transactions of Beijing institute of Technology, 2015, 35(s2): 157-160. DOI: 10.15918/j.tbit1001-0645.2015.S2.038

Simulation of Strong Battle Tanks Electronic Components Failure Mechanism Under the Shock Load

  • Aiming at frequent faults of inner electronic components of armored vehicles caused from transient shock vibration during artillery firing, statistically faults type and faults pattern of the electronic components was analyzed. Taking circuit board connector as the research object, structure and force analysis were implemented. On the basis of dynamic characteristics simulation and analysis, fault mechanism was verified under the impact load during artillery launch, and some improvement suggestions were put forward. It provides reference to optimization design and guarantees for armored vehicles electronic equipment in wartime.
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